Automated Optical Inspection Engineer

Job Objectives

To develop, program, and maintain Automated Optical Inspection (AOI) systems and processes to ensure effective and reliable detection of wafer and device-level defects, supporting yield and quality objectives in compound semiconductor wafer fabrication.

Duties and Responsibilities

• Develop and optimize AOI inspection recipes and programs for detecting wafer surface and device-level defects.

• Monitor AOI-related quality indices, including defect detection rate, false call rate, and inspection yield/throughput.

• Troubleshoot AOI equipment issues and inspection escapes; lead root cause analysis and corrective/preventive actions.

• Correlate AOI findings with downstream yield and quality data; support defect classification and Pareto analysis.

• Maintain AOI process documentation, recipe change control, and inspection standards/specifications.

• Support new product and process introduction by developing inspection criteria and AOI recipes for NPI/NPD projects.

• Collaborate with Process, Yield, and Equipment Engineering teams on defect reduction initiatives.

• Support the evaluation and qualification of AOI equipment upgrades, new inspection tools, or outsourced inspection vendors.

• Train and guide technicians and operators on AOI operation and defect classification.

• Prepare inspection and quality reports and project updates for management.

• Participate in LEAN and continuous improvement activities and special projects as assigned.

• Perform other reasonable duties as assigned.

Qualification Guidelines

Minimum Education

Bachelor's degree in engineering or sub-field of engineering

Minimum Experience

At least 5 years’ experience in facilities & maintenance, repair or servicing of equipment

Specific Knowledge / Skills

Experienced equipment engineer or field service engineering professional who is highly effective working in a team-oriented matrix organization.

Must have proven skills effective problem solving, troubleshooting and root cause failure analysis.